Electrical Transport Measurement (thin films and 2D materials)
The closed-cycle cryogen free cryostat with a temperature range from 10 K – 800 K provided by Janis Research Co., is our base setup for organic and inorganic thin-film TE material measurements.
We are designing stages for thermal conductivity, electrical conductivity, Hall mobility, Seebeck coefficient and Nernst coefficient measurements of different samples to be used inside the cryostat.
Lake Shore temperature controller is used for scanning the targetted temperature range.
Helium compressor is used to lower the temperature along with cold finger extension.